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Advances in X-ray analysis. Vol. 35Pacific-International Congress on X-Ray Analytical Methods (1 ; 1991 ; Hilo and Honolulu); Conference on Applications of X-Ray Analysis (1991 ; Hilo and Honolulu)Type of material - proceedings ; adult, seriousPublication and manufacture - New York ; London : Plenum Press, cop. 1992Language - englishISBN - 0-306-44249-3COBISS.SI-ID - 13470213
Author
Pacific-International Congress on X-Ray Analytical Methods |
Conference on Applications of X-Ray Analysis
Other authors
Barrett, Charles Sanborn
Topics
analizna kemija |
x-žarkovne analitske metode |
industrijske aplikacije |
x-žarkovna spektrometrija |
matematične metode |
analize površin |
tanki filmi |
totalna refleksija |
instrumentacija |
XRS tehnike |
x-žarkovno slikanje |
x-žarkovna tomografija |
metode celega vzorca |
Rietveldova analiza |
izračunani difrakcijski vzorci |
kvantitativna fazna analiza |
mrežni defekti |
x-žarkovna topografija |
analize tekstur |
referenčni materiali |
ugotavljanje obremenitev |
meje določitve |
superprevodniki |
minerali |
organske spojine
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Library/institution |
City | Acronym | For loan | Other holdings |
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Central Technological Library of the University of Ljubljana | Ljubljana | CTK |
outside loan 2 cop.
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Database name | Field | Year |
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Barrett, Charles Sanborn | ![]() |
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