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The variation of quasicrystal defect contrast [Elektronski vir] : how and why
Klein, H. ...
We carried out a systematic study of typical defect contrasts in various single grains of icosahedral Al-Pd-Mn quasicrystals. White-beam topographs with different sample-to-detector distances and ...multiple-crystal topographs with different sample-to-detector distances, different working points on the rocking curve and different harmonic reflections have been recorded. Despite the extreme geometrical resolution at the ID19 topography beamline of the ESRF, white-beam topography showed reasonable (not blurred) contrast only for very short sample-to-detector distances ({<}4 cm). Depending on the defect type, in synchrotron multiple-crystal topography the defect contrast changes considerably as a function of the position of the working point on the rocking curve. Under the special conditions chosen, the dependence of contrast shape and size on the harmonic reflection used was rather weak.
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