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  • Investigation of microwave loss induced by oxide regrowth in high-Q niobium resonators [Elektronski vir]
    Verjauw, Jeroen ...
    Source: Physical review applied [Elektronski vir]. - ISSN 2331-7019 (Vol. 16, iss. 1, 2021, str. 014018-1-014018-14)
    Type of material - e-article ; adult, serious
    Publish date - 2021
    Language - english
    COBISS.SI-ID - 148526851
    DOI