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  • Quantitative high-resolution HAADF-STEM analysis of inversion boundaries in ▫$Sb_2O_3$▫-doped zinc oxide
    Yamazaki, Takashi ...
    Source: Ultramicroscopy. - ISSN 0304-3991 (Vol. 98, 2004, str. 305-316)
    Type of material - article, component part
    Publish date - 2004
    Language - english
    COBISS.SI-ID - 18148903

source: Ultramicroscopy. - ISSN 0304-3991 (Vol. 98, 2004, str. 305-316)
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