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  • Depth ependences of the ion bombardment induced roughness and of the interdiffusion coefficient for Si/Al mutilayers
    Wang, Jiang Yong ; Zalar, Anton ; Mittemeijer, E. J.
    Source: Applied Surface Science. - ISSN 0169-4332 (Vol. 222, 2004, str. 171-179)
    Type of material - article, component part
    Publish date - 2004
    Language - english
    COBISS.SI-ID - 18400295