Physical principles of electron microscopy : an introduction to TEM, SEM and AEM

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Physical principles of electron microscopy : an introduction to TEM, SEM and AEM

Egerton, R. F.

Type of material - book ; adult, serious

Edition - 2nd ed.

Publication and manufacture - [Cham] : Springer, cop. 2016

Language - english

ISBN - 978-3-319-39876-1; 978-3-319-39877-8

COBISS.SI-ID - 39116805

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Library/institution	City	Acronym	For loan	Other holdings
Central Technological Library of the University of Ljubljana	Ljubljana	CTK	outside loan 1 cop.

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Egerton, R. F.

Source: Personal bibliographies and: SICRIS

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