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Cantilever method for determination of D31 coefficient in thin piezoelectric films = Metoda za določanje koeficienta d31 tankih piezoelektričnih filmovPenič, Samo ...Source: Informacije MIDEM : časopis za mikroelektroniko, elektronske sestavne dele in materiale = časopis za mikroelektroniku, elektronske sastavne dijelove i materijale = journal of microelectronics, electronic components and materials. - ISSN 0352-9045 (Letn. 39, št. 2, mar. 2009, str. 85-92)Type of material - article, component part ; adult, seriousPublish date - 2009Language - englishCOBISS.SI-ID - 7570516
Author
Penič, Samo |
Aljančič, Uroš |
Resnik, Drago |
Vrtačnik, Danilo |
Možek, Matej |
Amon, Slavko
Topics
piezoelektrik |
karakterizacija |
d31 koeficient |
PZT |
simulacija |
silicij |
FEM |
ANSYS |
piezoelectric |
characterization |
d31 coefficient |
PZT |
simulation |
FEM |
ANSYS
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Database name | Field | Year |
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Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
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Penič, Samo | 28467 |
Aljančič, Uroš | 11682 |
Resnik, Drago | 05075 |
Vrtačnik, Danilo | 04383 |
Možek, Matej | 20186 |
Amon, Slavko | 01926 |
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