Characterization of microstructures by analytical electron microscopy (AEM) [Elektronski vir] : Wei guan zu zhi de fen xi dian zi xian wei xue biao zheng
Rong, Yonghua
Type of material - e-book
Publication and manufacture - Beijing : Higher Education Press ; Berlin ; New York : Springer, cop. 2012
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english
ISBN - 978-1-4619-2486-9; 1-4619-2486-3; 978-3-642-20119-6; 3-642-20119-9
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