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Applied surface analysis : a symposium spons. by ASTM Committee E-42 on Surface Analysis American Society for Testing and Materials, Cleveland, Ohio 28 Feb. - 1 March, 1978Symposium on Applied surface analysis (1978 ; Cleveland, Ohio)Type of material - proceedingsPublication and manufacture - Philadelphia : ASTM, 1980Language - englishCOBISS.SI-ID - 9693957
Author
Symposium on Applied surface analysis
Other authors
Barr, T. L.
Topics
kemija |
analize površin |
Augerjeva elektronska spektroskopija |
x-žarkovna fotoelektronska spektroskopija |
spektroskopija ionskega sipanja |
sekundarna ionska masna spektrometrija |
zlitine |
površinska sestava |
obdelave podatkov |
kalibracija |
aplikacije |
raziskave korozije |
zborniki
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Central Technological Library of the University of Ljubljana |
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0000023661/0000000699 Skladišče IN: 198000624 23661/699 Skladišče IN: 198000624 |
available - outside loan, loan period: 14 days
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