VLSI test principles and architectures : design for testability

Faculty of Electrical Engineering, Lj. (FERLJ)

VLSI test principles and architectures : design for testability

Type of material - handbook

Publication and manufacture - Amsterdam [etc.] : Elsevier, M. Kaufmann, cop. 2006

Language - english

ISBN - 978-0-12-370597-6; 0-12-370597-5

COBISS.SI-ID - 57616129

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Faculty of Electrical Engineering, Lj.	available - outside loan, loan period: 14 days

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š 621.38 VLSI TEST ... IN: 0061223	available - outside loan, loan period: 14 days
IN:0053563	on loan - outside loan, due date: not specified
IN:0055780	on loan - outside loan, due date: not specified

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Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Wang, Laung-Terng

Source: Personal bibliographies and: SICRIS

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