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Jožef Stefan Institute, Lj. (IJS)
  • Characterization of thin films and surfaces by ion-beam analytical techniques
    Pelicon, Primož ...
    Source: Proceedings (str. 595-602)
    Type of material - conference contribution
    Publish date - 1999
    Language - english
    COBISS.SI-ID - 14617127

source: Proceedings (str. 595-602)

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