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Jožef Stefan Institute, Lj. (IJS)
  • ▫$Ta_2O_5$▫-based high-K dielectric thin films from solution processed at low temperatures
    Frunza, Raluca C. ...
    Source: Materials research bulletin. - ISSN 0025-5408 (Vol. 50, 2014, str. 323-328)
    Type of material - article, component part
    Publish date - 2014
    Language - english
    COBISS.SI-ID - 27297831
    DOI

source: Materials research bulletin. - ISSN 0025-5408 (Vol. 50, 2014, str. 323-328)

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