Quantitative x-ray diffractometry

National Institute of Chemistry, Lj. (KILJ)

Quantitative x-ray diffractometry

Zevin, Lev S. ; Kimmel, Giora

Type of material - book

Publication and manufacture - New York [etc.] : Springer, 1995

Language - english

ISBN - 0-387-94541-5

COBISS.SI-ID - 679450

Keep searching

Holdings
Availability in other libraries

Call number – location, accession no. ...	Copy status	Reservation
L09 543 ZEVIN LEV S. Quantitative	on loan - outside loan, due date: not specified

Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.

Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system

Source: Personal bibliographies and: SICRIS

The material from the parent unit is free. If the material is delivered to the pickup location from another unit, the library may charge you for this service.

Pickup location	Material status	Reservation

Upload image

Shelf entry

Adding material to shelf was successful.

Adding material to shelf failed.

It was not necessary to add the material to the shelf.

Permalink

E-mail

Impact factor

Select the library membership card:

DRS, in which the journal is indexed

Select pickup location:

Material pickup by post

Notification

Citations

Subject headings in COBISS General List of Subject Headings

Select pickup location

Reservation was successful.

Reservation failed.

Reservation...

Bibliographic data

Number of loans

Loan was successful

Loan failed

Loan was successful

Loan failed

Loan was successful

Loan failed

Loan was successful

Loan failed

Theme