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  • A High-Speed 7.2-ns Read-Wr... A High-Speed 7.2-ns Read-Write Random Access 4-Mb Embedded Resistive RAM (ReRAM) Macro Using Process-Variation-Tolerant Current-Mode Read Schemes
    Meng-Fan Chang; Shyh-Shyuan Sheu; Ku-Feng Lin ... IEEE journal of solid-state circuits, 03/2013, Volume: 48, Issue: 3
    Journal Article
    Peer reviewed

    ReRAM is a promising next-generation nonvolatile memory (NVM) with fast write speed and low-power operation. However, ReRAM faces two major challenges in read operations: 1) low read yield due to ...
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  • RNA‐binding protein insulin... RNA‐binding protein insulin‐like growth factor II mRNA‐binding protein 3 expression promotes tumor invasion and predicts early recurrence and poor prognosis in hepatocellular carcinoma
    Jeng, Yung‐Ming; Chang, Cheng‐Chi; Hu, Fu‐Chang ... Hepatology (Baltimore, Md.), October 2008, 2008-Oct, 20081001, Volume: 48, Issue: 4
    Journal Article
    Peer reviewed
    Open access

    Insulin‐like growth factor II mRNA‐binding protein 3 (IMP3) is an RNA‐binding protein expressed in embryonic tissues and multiple cancers. To investigate the role of IMP3 in hepatocellular carcinoma ...
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  • Cytoplasmic CD24 expression... Cytoplasmic CD24 expression is a novel prognostic factor in diffuse-type gastric adenocarcinoma
    Chou, Yuh-Yu; Jeng, Yung-Ming; Lee, Tan-Tsao ... Annals of surgical oncology, 10/2007, Volume: 14, Issue: 10
    Journal Article
    Peer reviewed

    CD24, a mucin like cell surface adhesion molecule and a ligand for P-selectin, has been reported as a prognostic factor in a variety of human cancers. However, the role of CD24 in gastric ...
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  • A 4Mb embedded SLC resistiv... A 4Mb embedded SLC resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability
    Shyh-Shyuan Sheu; Meng-Fan Chang; Ku-Feng Lin ... 2011 IEEE International Solid-State Circuits Conference, 2011-Feb.
    Conference Proceeding

    This work proposes process/resistance variation-insensitive read schemes for embedded RRAM to achieve fast read speeds with high yields. An embedded mega-bit scale (4Mb), single-level-cell (SLC) RRAM ...
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  • Failure mechanism for input... Failure mechanism for input buffer under CDM test
    Kao, Tzu-Cheng; Hung, Chung-Yu; Lee, Jian-Hsing ... Electronics letters, 04/2014, Volume: 50, Issue: 9
    Journal Article
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    Open access

    The influence of the body layout on the charged device model (CDM) failure site and the robustness of the input buffer is explored. The failure analysis results confirm that the gate oxide is ...
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  • CD24 expression is a progno... CD24 expression is a prognostic factor in intrahepatic cholangiocarcinoma
    Su, Min-Cheng; Hsu, Chiun; Kao, Hsin-Lien ... Cancer letters, 04/2006, Volume: 235, Issue: 1
    Journal Article
    Peer reviewed
    Open access

    CD24, a cell surface protein originally identified in hematological malignancy, were found to be expressed in a large variety of solid tumors. It can function as a ligand for P-selectin, an adhesion ...
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  • Enhanced CDM-robustness for... Enhanced CDM-robustness for the packaged IC with the extra bonding wire to the die-attach plate
    Tzu-Cheng Kao; Jian-Hsing Lee; Chen-Hsin Lien ... 2015 IEEE International Reliability Physics Symposium, 2015-April
    Conference Proceeding

    From the experimental measurements, the dominant charge source for a packaged IC chip during a charged-device model (CDM) ESD event is the capacitor between the die-attach plate and the metal bus ...
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  • Nuclear translocation of be... Nuclear translocation of beta-catenin protein but absence of beta-catenin and APC mutation in gastrointestinal carcinoid tumor
    Su, Min-Cheng; Wang, Chia-Chi; Chen, Chun-Chin ... Annals of surgical oncology, 12/2006, Volume: 13, Issue: 12
    Journal Article
    Peer reviewed

    Carcinoid tumors are a group of heterogeneous tumors with neuroendocrine differentiation and are mainly located in the gastrointestinal tract. A high frequency of cytoplasmic accumulation and/or ...
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  • Robust ESD self-protected L... Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering
    Tzu-Cheng Kao; Chen-Hsin Lien; Chien-Wei Chiu ... 2015 IEEE International Reliability Physics Symposium, 2015-April
    Conference Proceeding

    A new enhanced displacement-current triggering by adding floating P+ diffusions at each source finger edge for the HV LDNMOSFET is proposed. Unlike the conventional substrate-triggered ESD protection ...
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