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21.	Revealing Copper Contamination in Silicon after Low Temperature Treatments Polignano, Maria Luisa; Brivio, Jacopo; Codegoni, Davide ... Meeting abstracts, 07/2009, Volume: MA2009-02, Issue: 22 Journal Article Open access	Full text Available for: NUK, UL, UM, UPUK PDF
22.	Mechanical Stress and Defect Formation in Device Processing Polignano, Maria Luisa; Carnevale, Gianpietro; Fantini, Paolo ... Meeting abstracts (Electrochemical Society), 06/2006, Volume: MA2006-02, Issue: 25 Journal Article	Full text Available for: NUK, UL, UM, UPUK
23.	Nickel Contamination in Silicon: Electrical Activity Study and Microscopy Analysis Polignano, Maria-Luisa; Codegoni, Davide; Riva, Andrea ... Meeting abstracts, 08/2008, Volume: MA2008-02, Issue: 26 Journal Article Open access	Full text Available for: NUK, UL, UM, UPUK
24.	Evaluation of prothrombin F1+2 fragment after videolaparoscopic surgery Vannucchi, P L; Ridolfi, B; Biliotti, G ... Thrombosis research, 07/1994, Volume: 75, Issue: 2 Journal Article Peer reviewed	Full text Available for: SBJE
25.	$Improved TEM Sample Preparation by Low Energy FIB for Strain Analysis by Convergent Beam Electron Diffraction$ Improved TEM Sample Preparation by Low Energy FIB for Strain Analysis by Convergent Beam Electron Diffraction Balboni, Roberto; Borionetti, Gabriella; Moiraghi, Luigi ... Meeting abstracts, 07/2009, Volume: MA2009-02, Issue: 22 Journal Article Open access	Full text Available for: NUK, UL, UM, UPUK
26.	Niobium Contamination in Silicon Polignano, Maria Luisa; Codegoni, Davide; Borionetti, Gabriella ... Meeting abstracts (Electrochemical Society), 07/2010, Volume: MA2010-02, Issue: 23 Journal Article	Full text Available for: NUK, UL, UM, UPUK
27.	Comparability of TXRF Systems at Different Laboratories Nutsch, Andreas; Beckhoff, Burkhard; Altmann, Roswitha ... Meeting abstracts (Electrochemical Society), 07/2009, Volume: MA2009-02, Issue: 22 Journal Article	Full text Available for: NUK, UL, UM, UPUK
28.	Assessing Various Analytical Techniques with Different Lateral Resolution by Investigating Spin-coated Inorganic Contamination on Si Surfaces Beckhoff, Burkhard; Nutsch, Andreas; Altmann, Roswitha ... Meeting abstracts (Electrochemical Society), 07/2009, Volume: MA2009-02, Issue: 22 Journal Article	Full text Available for: NUK, UL, UM, UPUK

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