E-resources
-
Xueliang Zhou; Pingyu Jiang; Yan Wang
2015 IEEE International Conference on Mechatronics and Automation (ICMA), 08/2015Conference Proceeding
Focusing on the issue of quality tracing for discrete manufacturing workshop, a conceptual framework for quality tracing system integrating product batch information tracing and root causes tracing for quality faults is proposed. Based on the machining process-related batch information, quality information and machining status information, which are automatically real-time collected by using RFID technology and Auto-ID computing technology, the proposed system can carry out forward traceability, backward traceability and root causes tracing for quality accidents. Then, key enabling technologies for the system is presented in detail. Finally, a prototype system based on browser/server (B/S) architecture is developed, and a simple case is given to verify the feasibility of the proposed framework.
![loading ... loading ...](themes/default/img/ajax-loading.gif)
Shelf entry
Permalink
- URL:
Impact factor
Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.
Year | Impact factor | Edition | Category | Classification | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Select the library membership card:
If the library membership card is not in the list,
add a new one.
DRS, in which the journal is indexed
Database name | Field | Year |
---|
Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
---|
Source: Personal bibliographies
and: SICRIS
The material is available in full text. If you wish to order the material anyway, click the Continue button.