E-resources
-
Yun, Sukmin; Park, Jongjin; Lee, Kimin; Shin, Jinwoo
2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)Conference Proceeding
Deep neural networks with millions of parameters may suffer from poor generalization due to overfitting. To mitigate the issue, we propose a new regularization method that penalizes the predictive distribution between similar samples. In particular, we distill the predictive distribution between different samples of the same label during training. This results in regularizing the dark knowledge (i.e., the knowledge on wrong predictions) of a single network (i.e., a self-knowledge distillation) by forcing it to produce more meaningful and consistent predictions in a class-wise manner. Consequently, it mitigates overconfident predictions and reduces intra-class variations. Our experimental results on various image classification tasks demonstrate that the simple yet powerful method can significantly improve not only the generalization ability but also the calibration performance of modern convolutional neural networks.
![loading ... loading ...](themes/default/img/ajax-loading.gif)
Shelf entry
Permalink
- URL:
Impact factor
Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.
Year | Impact factor | Edition | Category | Classification | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Select the library membership card:
If the library membership card is not in the list,
add a new one.
DRS, in which the journal is indexed
Database name | Field | Year |
---|
Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
---|
Source: Personal bibliographies
and: SICRIS
The material is available in full text. If you wish to order the material anyway, click the Continue button.