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  • HIGH RESOLUTION EDDY CURREN...
    Marchand, B; Vacher, F; Gilles-Pascaud, C; Decitre, J M; Fermon, C

    Review of Progress in Quantitative Nondestructive Evaluation Volume 27A (AIP Conference Proceedings Volume 975), 01/2008, Volume: 975
    Journal Article

    New industrial Non Destructive Testing requires the development of new probes: technologies such as high spatial resolution probes for small breaking flaws detection or flexible probes for complex curved surfaces inspection. The CEA/LIST has designed and integrated 2 probes to answer industrial's constraints. The first one is based on Giant Magneto-Resistance and is able to detect 50 mum3 flaws. The second one is based on micro-coils etched on kapton and its flexibility is adapted to curved surfaces inspection. Both are multi-elements probes, allowing fast inspection. This paper presents those new probes, their design and their performances.