PERCIVAL: possible applications in X-ray micro-tomography

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PERCIVAL: possible applications in X-ray micro-tomography

Pinaroli, G.; Lautizi, G.; Donato, S.; Stebel, L.; Cautero, G.; Giuressi, D.; Gregori, I.; Zilio, S. Dal; Sergo, R.; Scarcia, M.; Cudin, I.; Wunderer, C.B.; Correa, J.; Marras, A.; Aplin, S.; Boitrelle, B.; Orsini, F.; Goettlicher, P.; Kuhn, M.; Lange, S.; Niemann, M.; Shevyakov, I.; Zimmer, M.; Guerrini, N.; Marsh, B.; Sedgwick, I.; Greer, A.; Nicholls, T.; Pedersen, U.K.; Tartoni, N.; Hyun, H.; Kim, K.; Rah, S.; Graafsma, H.; Menk, R.H.

Journal of instrumentation, 02/2020, Volume: 15, Issue: 2

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