E-resources
Peer reviewed
-
Yimin Yang; Wu, Q. M. Jonathan
IEEE transactions on cybernetics, 11/2016, Volume: 46, Issue: 11Journal Article
The extreme learning machine (ELM), which was originally proposed for "generalized" single-hidden layer feedforward neural networks, provides efficient unified learning solutions for the applications of clustering, regression, and classification. It presents competitive accuracy with superb efficiency in many applications. However, ELM with subnetwork nodes architecture has not attracted much research attentions. Recently, many methods have been proposed for supervised/unsupervised dimension reduction or representation learning, but these methods normally only work for one type of problem. This paper studies the general architecture of multilayer ELM (ML-ELM) with subnetwork nodes, showing that: 1) the proposed method provides a representation learning platform with unsupervised/supervised and compressed/sparse representation learning and 2) experimental results on ten image datasets and 16 classification datasets show that, compared to other conventional feature learning methods, the proposed ML-ELM with subnetwork nodes performs competitively or much better than other feature learning methods.
![loading ... loading ...](themes/default/img/ajax-loading.gif)
Shelf entry
Permalink
- URL:
Impact factor
Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.
Year | Impact factor | Edition | Category | Classification | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Select the library membership card:
If the library membership card is not in the list,
add a new one.
DRS, in which the journal is indexed
Database name | Field | Year |
---|
Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
---|
Source: Personal bibliographies
and: SICRIS
The material is available in full text. If you wish to order the material anyway, click the Continue button.