The noise-shaping successive approximation register (NS-SAR) analog-to-digital converter (ADC) is an emerging hybrid architecture that achieves high resolution and power efficiency simultaneously by combining the merits of the SAR ADC and the <inline-formula> <tex-math notation="LaTeX">\Delta \Sigma </tex-math></inline-formula> ADC. Most prior works adopting the cascaded integrator feed-forward (CIFF) structure demonstrate inefficiency in realizing optimized noise transfer function (NTF). This paper presents a second-order NS-SAR ADC employing the error-feedback (EF) structure to realize complex NTF zeros for noise-shaping enhancement with the minimum modification to a standard SAR. It implements a low-power scaling-friendly EF path by using a passive finite impulse response (FIR) and a comparator-reused dynamic amplifier with process-voltage-temperature (PVT) tracking background calibration. Fabricated in 40-nm CMOS, the prototype chip consumes <inline-formula> <tex-math notation="LaTeX">84~\mu \text{W} </tex-math></inline-formula> when operating at 10 MS/s. The NS-SAR achieves peak Schreier FoM of 178 dB with 79-dB signal to noise and distortion ratio (SNDR) at an oversampling ratio (OSR) of 8.