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McKay, David C; Sheldon, Sarah; Smolin, John A; Chow, Jerry M; Gambetta, Jay M
Physical review letters, 2019-May-24, Volume: 122, Issue: 20Journal Article
As quantum circuits increase in size, it is critical to establish scalable multiqubit fidelity metrics. Here we investigate, for the first time, three-qubit randomized benchmarking (RB) on a quantum device consisting of three fixed-frequency transmon qubits with pairwise microwave-activated interactions (cross-resonance). We measure a three-qubit error per Clifford of 0.106 for all-to-all gate connectivity and 0.207 for linear gate connectivity. Furthermore, by introducing mixed dimensionality simultaneous RB-simultaneous one- and two-qubit RB-we show that the three-qubit errors can be predicted from the one- and two-qubit errors. However, by introducing certain coherent errors to the gates, we can increase the three-qubit error to 0.302, an increase that is not predicted by a proportionate increase in the one- and two-qubit errors from simultaneous RB. This demonstrates the importance of multiqubit metrics, such as three-qubit RB, on evaluating overall device performance.
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