E-resources
Peer reviewed
Open access
-
Li, Y.; Bromberg, C.; Diwan, M.; Kettell, S.; Martynenko, S.; Qian, X.; Paolone, V.; Stewart, J.; Thorn, C.; Zhang, C.
Journal of instrumentation, 11/2022, Volume: 17, Issue: 11Journal Article
Abstract The ability of free electrons to drift long distances at high velocities in pure liquid argon under an applied electric field has been exploited for the past forty years to implement detectors with increasingly larger volumes for high energy physics research. The attachment of free electrons to impurities in the LAr is an important limit on the free instrumented volume of these extremely large detectors, and impurity concentrations as small as 100 ppt can reduce their resolution and efficiency. In this paper, we summarize the electron attachment rate constants as a function of the applied electric field, for common impurities in LArTPCs, obtained from data in the literature. We further provide analytical functions to parameterize the data, which are useful to compare with new measurements, to model and analyze the performance of existing detectors, and to predict the performance of new detectors.
Author
Shelf entry
Permalink
- URL:
Impact factor
Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.
Year | Impact factor | Edition | Category | Classification | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Select the library membership card:
If the library membership card is not in the list,
add a new one.
DRS, in which the journal is indexed
Database name | Field | Year |
---|
Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
---|
Source: Personal bibliographies
and: SICRIS
The material is available in full text. If you wish to order the material anyway, click the Continue button.