Ultra‐Large Scale Stitchless AFM: Advancing Nanoscale Characterization and Manipulation with Zero Stitching Error and High Throughput (Small 1/2024)

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Ultra‐Large Scale Stitchless AFM: Advancing Nanoscale Characterization and Manipulation with Zero Stitching Error and High Throughput (Small 1/2024)

Liu, Yijie; Li, Xuexuan; Zhang, Yuliang; Ge, Lin; Guan, Yingchun; Zhang, Zhen

Small (Weinheim an der Bergstrasse, Germany), January 4, 2024, Volume: 20, Issue: 1

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Atomic Force Microscopy In article number 2303838, Yingchun Guan, Zhen Zhang, and co‐workers present an ultra‐large scale stitchless atomic force microscopy (AFM) through a synergistic integration with a compliant nano‐manipulator. It enables high‐throughput characterization of ultra‐large scale samples without stitching or bow errors, expanding the scanning area of conventional AFMs by two orders of magnitude.

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