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  • The Nanoscale Morphology of...
    Staniec, Paul A.; Parnell, Andrew J.; Dunbar, Alan D. F.; Yi, Hunan; Pearson, Andrew J.; Wang, Tao; Hopkinson, Paul E.; Kinane, Christy; Dalgliesh, Robert M.; Donald, Athene M.; Ryan, Anthony J.; Iraqi, Ahmed; Jones, Richard A. L.; Lidzey, David G.

    Advanced energy materials, July, 2011, Volume: 1, Issue: 4
    Journal Article

    Neutron reflectivity and X‐ray scattering have been used to characterise the structure of photovoltaic optimised PCDTBT:PCBM (1:4) blend films. A negative gradient of the PCBM forms spontaneously upon film casting – a fortuitous structure that is well matched for efficient charge extraction. Mild thermal annealing at 70 °C does not significantly modify the film structure, and any improvement in device efficiency is likely to be through the removal of trapped casting solvent.