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  • A microfocus X-ray fluoresc...
    Tiwari, M. K.; Gupta, P.; Sinha, A. K.; Kane, S. R.; Singh, A. K.; Garg, S. R.; Garg, C. K.; Lodha, G. S.; Deb, S. K.

    Journal of synchrotron radiation, 03/2013, Volume: 20, Issue: 2
    Journal Article

    A microfocus X‐ray fluorescence spectroscopy beamline (BL‐16) at the Indian synchrotron radiation facility Indus‐2 has been constructed with an experimental emphasis on environmental, archaeological, biomedical and material science applications involving heavy metal speciation and their localization. The beamline offers a combination of different analytical probes, e.g. X‐ray fluorescence mapping, X‐ray microspectroscopy and total‐external‐reflection fluorescence characterization. The beamline is installed on a bending‐magnet source with a working X‐ray energy range of 4–20 keV, enabling it to excite K‐edges of all elements from S to Nb and L‐edges from Ag to U. The optics of the beamline comprises of a double‐crystal monochromator with Si(111) symmetric and asymmetric crystals and a pair of Kirkpatrick–Baez focusing mirrors. This paper describes the performance of the beamline and its capabilities with examples of measured results.