E-resources
-
Sirk, Martin M.; Korpela, Eric J.; Ishikawa, Yuzo; Edelstein, Jerry; Wishnow, Edward H.; Smith, Christopher; McCauley, Jeremy; McPhate, Jason B.; Curtis, James; Curtis, Travis; Gibson, Steven R.; Jelinsky, Sharon; Lynn, Jeffrey A.; Marckwordt, Mario; Miller, Nathan; Raffanti, Michael; Van Shourt, William; Stephan, Andrew W.; Immel, Thomas J.
Space science reviews, 10/2017, Volume: 212, Issue: 1-2Journal Article
We present the design, implementation, and on-ground performance measurements of the Ionospheric Connection Explorer EUV spectrometer, ICON EUV , a wide field ( 17 ∘ × 12 ∘ ) extreme ultraviolet (EUV) imaging spectrograph designed to observe the lower ionosphere at tangent altitudes between 100 and 500 km. The primary targets of the spectrometer, which has a spectral range of 54–88 nm, are the O ii emission lines at 61.6 nm and 83.4 nm. Its design, using a single optical element, permits a 0 . ∘ 26 imaging resolution perpendicular to the spectral dispersion direction with a large ( 12 ∘ ) acceptance parallel to the dispersion direction while providing a slit-width dominated spectral resolution of R ∼ 25 at 58.4 nm. Pre-flight calibration shows that the instrument has met all of the science performance requirements.
Author
Shelf entry
Permalink
- URL:
Impact factor
Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.
Year | Impact factor | Edition | Category | Classification | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Select the library membership card:
If the library membership card is not in the list,
add a new one.
DRS, in which the journal is indexed
Database name | Field | Year |
---|
Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
---|
Source: Personal bibliographies
and: SICRIS
The material is available in full text. If you wish to order the material anyway, click the Continue button.