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  • Low energy alpha particle spectroscopy using CR-39 detector
    Izerrouken, M. ; Skvarč, Jure, 1964- ; Ilić, Radomir
    The possibility of using CR-39 to measure the depth profile of ▫$^{10}$▫B in Si is analysed. The measuring technique exploits the ▫$^{10}$▫B(n, $▫\alpha$▫) Li nuclear reaction. For this reason the ... track parameters (size,optical properties) of low energy alpha-particles (<1,47 MeV) were studied. The results showed that an energy resolution of about 100 keV could obtained by appropriate selection of etching conditions. The profile of $▫^{10}$▫B in Si at a depth as small as 1 ▫$\mu$▫m can be measured.
    Vrsta gradiva - prispevek na konferenci
    Leto - 1999
    Jezik - angleški
    COBISS.SI-ID - 14310183