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  • AES, EDS, SEM and XPS analysis of the protective oxide and nitride layers formed on stainless steel during thermal treatment
    Mandrino, Djordje, 1964-2021 ...
    Protective layers on stainless steel were prepared by thermal treatments in air and two controlled atmospheres resulting in the formation of an oxide and/or nitride layer on the surface of the ... material. Layers' surfaces were imaged by scanning electron microscopy (SEM). Energy-dispersive spectroscopy (EDS) was used to check the elemental composition of the substrate. Auger electron spectroscopy (AES) depth profiles of the samples were measured. On some samples, X-ray photoelectron spectroscopy (XPS) depth profiling was also performed to check its suitability for obtaining information about the chemical phases along the depth of the layer. Results from AES and XPS depth profilings were found to be in general agreement. The analysed samples showed considerable differences with respect to their surface morphology, protective layer thicknesses, compositions and layer-metal interface thicknesses. Basic corrosion properties of the layers were also measured. The layer characteristics' dependence on the thermal treatment and the atmospheric parameters are discussed.
    Vrsta gradiva - prispevek na konferenci
    Leto - 2006
    Jezik - angleški
    COBISS.SI-ID - 569258