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  • Using a FIB to prepare Al(OH)3 samples for the TEM = Uporaba FIB za pripravo vzorcev Al(OH)3 za TEM
    Nikolić, Irena, metalurginja ...
    One of the basic applications of a focused ion beam (FIB) tool is the preparation of samples for transmission electron microscopy (TEM) analysis. A dual-beam FIB system combines miltiple experimental ... systems within the same chamber and the combinations of different techniques can be accommodated by unique sample preparation, manipulation and analysis methods. The system contains both the focused Ga[sup]+ ion beam and a field-emission scanning electron column. In this paper we described a procedure for preparing Al(OH)[sub]3 for TEM analysis using a FIB.
    Vir: Materiali in tehnologije = Materials and technology. - ISSN 1580-2949 (Letn. 42, št. 1, jan.-feb. 2008, str. 45-47)
    Vrsta gradiva - članek, sestavni del
    Leto - 2008
    Jezik - angleški
    COBISS.SI-ID - 687274

vir: Materiali in tehnologije = Materials and technology. - ISSN 1580-2949 (Letn. 42, št. 1, jan.-feb. 2008, str. 45-47)

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