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zadetkov: 305
301.
  • PbS-Si anisotype heterojunction characteristics
    Steckl, A.J.; Elabd, H.; Jakobus, Th 1977 International Electron Devices Meeting, 1977
    Conference Proceeding

    The operation of p-n PbS-Si heterojunction devices at 200 K and 300 K is reported. The I-V and C-V characteristics are presented and compared to those of p-p heterojunctions. At 200 K and a ...
Celotno besedilo
302.
  • MoSi2-gate MOSFET's for VLSI
    Chow, T.P.; Steckl, A.J.; Motamedi, M.E. ... 1979 International Electron Devices Meeting, 1979
    Conference Proceeding

    Refractory metal silicide gate n-channel MOSFET's have been fabricated by RF sputtering from a hot-pressed MoSi 2 alloy target. The annealed MoSi 2 sheet resistance was 2Ω/□. The MOSFET's were ...
Celotno besedilo
303.
  • Image Enhancement in High-R... Image Enhancement in High-Resoltuion Lithography Through Polymer Grafting Techniques
    Steckl, A. J.; Moore, J. A.; Corelli, J. C. ... 1984 Symposium on VLSI Technology. Digest of Technical Papers, 1984-september
    Conference Proceeding

    A major limitation of high resolution lithography techniques is the throughput, or the ability to create the appropriate image patterns in the resist at high speed. The resist sensitivity to incident ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
304.
Celotno besedilo
305.
Celotno besedilo
Dostopno za: IJS, NUK, UL

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