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zadetkov: 76
1.
  • Design, Simulation, Fabrica... Design, Simulation, Fabrication and Testing of Flexible Bow-Tie Antennas
    Durgun, A. C.; Balanis, C. A.; Birtcher, C. R. ... IEEE transactions on antennas and propagation, 12/2011, Letnik: 59, Številka: 12
    Journal Article
    Recenzirano

    Design, simulation, fabrication and measurement of two different novel flexible bow-tie antennas, a conventional and a modified bow-tie antenna with reduced metallization, are reported in this paper. ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
2.
  • An Optimized Subspace-Based... An Optimized Subspace-Based Approach to Synchrophasor Estimation
    Drummond, Zachary D.; Claytor, Kevin E.; Allee, David R. ... IEEE transactions on instrumentation and measurement, 2021, Letnik: 70
    Journal Article
    Recenzirano

    We present two improvements to the subspace-based phasor measurement unit (PMU) algorithms based on ESPRIT frequency estimation. The first is a dynamic, real-time thresholding method to determine the ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
3.
  • Flexible ISFET Biosensor Us... Flexible ISFET Biosensor Using IGZO Metal Oxide TFTs and an ITO Sensing Layer
    Smith, Joseph T.; Shah, Sahil S.; Goryll, Michael ... IEEE sensors journal, 2014-April, 2014-04-00, 20140401, Letnik: 14, Številka: 4
    Journal Article
    Recenzirano

    This letter presents the fabrication details and measured performance of a prototype flexible extended-gate ion-sensitive field effect transistor (ISFET) biosensor, manufactured using a metal oxide ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
4.
  • Planar Near-Field Electric ... Planar Near-Field Electric Field Sensor Array Applications Facilitated by Neural Networks
    Drummond, Zachary D.; Claytor, Kevin E.; Adelman, Ross N. ... IEEE sensors journal, 09/2021, Letnik: 21, Številka: 18
    Journal Article
    Recenzirano

    Electrical capacitance tomography is employed for various process tomography applications, typically with circular imaging regions (e.g., to estimate fluid levels in plastic pipes). Typical ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
5.
  • Circuit-Level Impact of a-S... Circuit-Level Impact of a-Si:H Thin-Film-Transistor Degradation Effects
    Allee, D.R.; Clark, L.T.; Vogt, B.D. ... IEEE transactions on electron devices, 06/2009, Letnik: 56, Številka: 6
    Journal Article
    Recenzirano

    This paper reviews amorphous silicon thin-film-transistor (TFT) degradation with electrical stress, examining the implications for various types of circuitry. Experimental measurements on ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
6.
  • Microelectromechanical Syst... Microelectromechanical Systems (MEMS) Based-Ultrasonic Electrostatic Actuators on a Flexible Substrate
    Sangpyeong Kim; Xu Zhang; Daugherty, R. ... IEEE electron device letters, 07/2012, Letnik: 33, Številka: 7
    Journal Article
    Recenzirano

    We present a microelectromechanical systems (MEMS)-based electrostatic actuator on a flexible substrate, made of polyethylene naphthalate, which emits acoustic waves at ultrasonic frequencies. The ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
7.
  • Stability of IZO and a-Si:H... Stability of IZO and a-Si:H TFTs Processed at Low Temperature (200 ^} )
    Kaftanoglu, K; Venugopal, S M; Marrs, M ... Journal of display technology, 06/2011, Letnik: 7, Številka: 6
    Journal Article

    Mixed-oxide thin-film transistors (TFTs) have been extensively researched due to their improved stability under electrical bias stress compared to amorphous-silicon TFTs. However, there are many ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
8.
  • Localization of Gate Bias I... Localization of Gate Bias Induced Threshold Voltage Degradation in a-Si:H TFTs
    Shringarpure, R.; Venugopal, S.; Clark, L.T. ... IEEE electron device letters, 2008-Jan., 2008, 2008-1-00, 20080101, Letnik: 29, Številka: 1
    Journal Article
    Recenzirano

    This letter describes a method to identify the channel region of hydrogenated amorphous silicon thin film transistors (a-Si:H TFTs) in which threshold voltage(V th ) degradation occurs. The TFTs are ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
9.
  • A Passive Very Low-Frequenc... A Passive Very Low-Frequency (VLF) Electric Field Imager
    Chung, Hugh E.; Weidong Ye; Vora, Sandeep G. ... IEEE sensors journal, 05/2016, Letnik: 16, Številka: 9
    Journal Article
    Recenzirano

    It is shown that an array of D-dot sensors can be implemented to not only detect, but for the first time, image very low-frequency electric fields. D-dot sensors sense current proportional to the ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
10.
  • CMOS TFT Op-Amps: Performan... CMOS TFT Op-Amps: Performance and Limitations
    Dey, A; Avendanno, A; Venugopal, S ... IEEE electron device letters, 05/2011, Letnik: 32, Številka: 5
    Journal Article
    Recenzirano

    In this letter, we demonstrate the feasibility of building thin-film transistor (TFT) complementary metal-oxide-semiconductor (CMOS) operational amplifiers (op-amps) at low temperature (180°C) for ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
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zadetkov: 76

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