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zadetkov: 158
1.
  • Creation and diagnosis of a... Creation and diagnosis of a solid-density plasma with an X-ray free-electron laser
    VINKO, S. M; CIRICOSTA, O; HAJKOVA, V ... Nature (London), 02/2012, Letnik: 482, Številka: 7383
    Journal Article
    Recenzirano

    Matter with a high energy density (>10(5) joules per cm(3)) is prevalent throughout the Universe, being present in all types of stars and towards the centre of the giant planets; it is also relevant ...
Celotno besedilo
Dostopno za: DOBA, IJS, IZUM, KILJ, KISLJ, NUK, PILJ, PNG, SAZU, SIK, UILJ, UKNU, UL, UM, UPUK
2.
Celotno besedilo
Dostopno za: CMK, CTK, FMFMET, IJS, NUK, PNG, UL, UM

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3.
Celotno besedilo

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4.
  • Time-Resolved XUV Opacity M... Time-Resolved XUV Opacity Measurements of Warm Dense Aluminum
    Vinko, S M; Vozda, V; Andreasson, J ... Physical review letters, 06/2020, Letnik: 124, Številka: 22
    Journal Article
    Recenzirano
    Odprti dostop

    The free-free opacity in plasmas is fundamental to our understanding of energy transport in stellar interiors and for inertial confinement fusion research. However, theoretical predictions in the ...
Celotno besedilo
Dostopno za: CMK, CTK, FMFMET, IJS, NUK, PNG, UL, UM

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5.
  • Detachment of epitaxial gra... Detachment of epitaxial graphene from SiC substrate by XUV laser radiation
    Vozda, V.; Medvedev, N.; Chalupský, J. ... Carbon (New York), 20/May , Letnik: 161
    Journal Article
    Recenzirano

    The thermal decomposition on silicon carbide (SiC) is one of the most used growth techniques for fabrication of epitaxial graphene. However, it significantly diminishes graphene’s otherwise ...
Celotno besedilo
Dostopno za: GEOZS, IJS, IMTLJ, KILJ, KISLJ, NLZOH, NUK, OILJ, PNG, SAZU, SBCE, SBJE, UILJ, UL, UM, UPCLJ, UPUK, ZAGLJ, ZRSKP
6.
  • Femtosecond x-ray diffracti... Femtosecond x-ray diffraction can discern nonthermal from thermal melting
    Medvedev, N.; Kopecky, M.; Chalupsky, J. ... Physical review. B, 03/2019, Letnik: 99, Številka: 10
    Journal Article
    Recenzirano

    We theoretically investigate which experimental observations enable discrimination between thermal and nonthermal melting in femtosecond laser pulse-irradiated semiconductors. We identify that ...
Celotno besedilo
Dostopno za: CMK, CTK, FMFMET, IJS, NUK, PNG, UM
7.
  • Electronic structure of an ... Electronic structure of an XUV photogenerated solid-density aluminum plasma
    Vinko, S M; Zastrau, U; Mazevet, S ... Physical review letters, 06/2010, Letnik: 104, Številka: 22
    Journal Article
    Recenzirano
    Odprti dostop

    By use of high intensity XUV radiation from the FLASH free-electron laser at DESY, we have created highly excited exotic states of matter in solid-density aluminum samples. The XUV intensity is ...
Celotno besedilo
Dostopno za: CMK, CTK, FMFMET, IJS, NUK, PNG, UM

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8.
  • Comparing different approac... Comparing different approaches to characterization of focused X-ray laser beams
    Chalupsky, J.; Bohacek, P.; Hajkova, V. ... Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 03/2011, Letnik: 631, Številka: 1
    Journal Article
    Recenzirano

    X-ray lasers represent a powerful tool to explore matter under extreme conditions. A rigorous characterization of their output parameters is, therefore, of substantial importance for the purposes of ...
Celotno besedilo
Dostopno za: GEOZS, IJS, IMTLJ, KILJ, KISLJ, NUK, OILJ, PNG, SAZU, SBCE, SBJE, UL, UM, UPCLJ, UPUK
9.
  • Single shot damage mechanis... Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure
    Khorsand, A R; Sobierajski, R; Louis, E ... Optics express, 01/2010, Letnik: 18, Številka: 2
    Journal Article
    Recenzirano
    Odprti dostop

    We investigated single shot damage of Mo/Si multilayer coatings exposed to the intense fs XUV radiation at the Free-electron LASer facility in Hamburg - FLASH. The interaction process was studied in ...
Celotno besedilo
Dostopno za: NUK, UL, UM, UPUK

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10.
  • Soft x-ray free electron la... Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
    Nelson, A J; Toleikis, S; Chapman, H ... Optics express, 09/2009, Letnik: 17, Številka: 20
    Journal Article
    Recenzirano
    Odprti dostop

    We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal ...
Celotno besedilo
Dostopno za: NUK, UL, UM, UPUK

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zadetkov: 158

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