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zadetkov: 55
1.
  • Behavior of molecules and m... Behavior of molecules and molecular ions near a field emitter
    Gault, Baptiste; Saxey, David W; Ashton, Michael W ... New journal of physics, 03/2016, Letnik: 18, Številka: 3
    Journal Article
    Recenzirano
    Odprti dostop

    The cold emission of particles from surfaces under intense electric fields is a process which underpins a variety of applications including atom probe tomography (APT), an analytical microscopy ...
Celotno besedilo
Dostopno za: NUK, UL, UM, UPUK

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2.
  • Comparative Apex Electrosta... Comparative Apex Electrostatics of Atom Probe Tomography Specimens
    Zhang, Qihua; Klein, Benjamin; Sanford, Norman A. ... Journal of electronic materials, 06/2021, Letnik: 50, Številka: 6
    Journal Article
    Recenzirano

    Rigorous electrostatic modeling of the specimen electrode environment is required to better understand the fundamental processes of atom probe tomography (APT) and guide the analysis of APT data. We ...
Celotno besedilo
Dostopno za: EMUNI, FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
3.
Celotno besedilo
4.
  • Engineering plant cell wall... Engineering plant cell walls: tuning lignin monomer composition for deconstructable biofuel feedstocks or resilient biomaterials
    Ciesielski, Peter N; Resch, Michael G; Hewetson, Barron ... Green chemistry : an international journal and green chemistry resource : GC, 01/2014, Letnik: 16, Številka: 5
    Journal Article
    Recenzirano

    Advances in genetic manipulation of the biopolymers that compose plant cell walls will facilitate more efficient production of biofuels and chemicals from biomass and lead to specialized biomaterials ...
Celotno besedilo
Dostopno za: IJS, KILJ, NUK, UL, UM
5.
  • An algorithm for correcting... An algorithm for correcting systematic energy deficits in the atom probe mass spectra of insulating samples
    Caplins, Benjamin W.; Blanchard, Paul T.; Chiaramonti, Ann N. ... Ultramicroscopy, 06/2020, Letnik: 213
    Journal Article
    Recenzirano
    Odprti dostop

    •Electrostatic effects degrade the quality of mass spectra for electrically insulating samples in straight-flight-path atom probe microscopes.•A parameter-free ‘systematic energy deficit’ correction ...
Celotno besedilo
Dostopno za: GEOZS, IJS, IMTLJ, KILJ, KISLJ, NLZOH, NUK, OILJ, PNG, SAZU, SBCE, SBJE, UILJ, UL, UM, UPCLJ, UPUK, ZAGLJ, ZRSKP

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6.
  • Optical Scattering Characte... Optical Scattering Characteristics of 3-D Lunar Regolith Particles Measured Using X-Ray Nano Computed Tomography
    Baidya, Somen; Melius, Mikolas; Hassan, Ahmed M. ... IEEE geoscience and remote sensing letters, 2022, Letnik: 19
    Journal Article
    Recenzirano
    Odprti dostop

    Shape, in addition to size and material composition, has a strong effect on the optical scattering characteristics of a particle. In this work, we computationally study how the measured 3-D shapes of ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
7.
  • Extreme Ultraviolet Radiati... Extreme Ultraviolet Radiation Pulsed Atom Probe Tomography of III-Nitride Semiconductor Materials
    Miaja-Avila, Luis; Caplins, Benjamin W; Chiaramonti, Ann N ... Journal of physical chemistry. C, 02/2021, Letnik: 125, Številka: 4
    Journal Article
    Recenzirano

    Laser-pulsed atom probe tomography (LAPT) is a materials characterization technique that has been widely applied in the study and characterization of III-nitride semiconductors. To date, most of ...
Celotno besedilo
Dostopno za: IJS, KILJ, NUK, PNG, UL, UM
8.
Celotno besedilo

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9.
Celotno besedilo

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10.
  • Field Ion Emission in an At... Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light
    Chiaramonti, Ann N; Miaja-Avila, Luis; Caplins, Benjamin W ... Microscopy and microanalysis 26, Številka: 2
    Journal Article
    Recenzirano
    Odprti dostop

    This paper describes initial experimental results from an extreme ultraviolet (EUV) radiation-pulsed atom probe microscope. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV ...
Celotno besedilo
Dostopno za: NUK, UL

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zadetkov: 55

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