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zadetkov: 12
1.
  • Direct Evidence of the Leak... Direct Evidence of the Leaky Emission in Oxide-Confined Vertical Cavity Lasers
    Ledentsov, Nikolay; Shchukin, Vitaly A.; Ledentsov, Nikolay N. ... IEEE journal of quantum electronics, 2016-March, 2016-3-00, 20160301, Letnik: 52, Številka: 3
    Journal Article
    Recenzirano

    We report the observation of narrow tilted lobes in the far-field emission pattern of leaky oxide-confined vertical-cavity surface-emitting lasers (VCSELs). The VCSEL cavity is surrounded by two ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
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Celotno besedilo
Dostopno za: IJS, NUK, UL
3.
  • Application of nanophotonic... Application of nanophotonics to the next generation of surface-emitting lasers
    Ledentsov, Nikolay N.; Ledentsov, Nikolay; Agustin, Mikel ... Nanophotonics (Berlin, Germany), 09/2017, Letnik: 6, Številka: 5
    Journal Article
    Recenzirano
    Odprti dostop

    Novel trends and concepts in the design and fabrication of vertical cavity surface-emitting lasers (VCSELs) and their integration in optical networks and implementation in integrated photonics ...
Celotno besedilo
Dostopno za: NUK, UL, UM, UPUK

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Celotno besedilo

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5.
  • High Speed Optical Data Tra... High Speed Optical Data Transmission With Compact 850 nm TO-Can Assemblies
    Turkiewicz, Jaroslaw P.; Kropp, Jorg-R; Ledentsov, Nikolay N. ... IEEE journal of quantum electronics, 04/2014, Letnik: 50, Številka: 4
    Journal Article
    Recenzirano

    Key components of the optical interconnects are the fully integrated optical transmitter and receiver subassemblies. The required features of such components include high bit rate and energy ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
6.
  • Single TO-can GPON ONU bi-directional optical sub-assembly with Si-Micromechanics
    Mao-Chieh Hsu; Halmo, Leos; Kropp, Joerg-R 2017 IEEE CPMT Symposium Japan (ICSJ), 2017-Nov.
    Conference Proceeding

    We present a new bidirectional optical subassembly (BOSA) packaging method which utilizes silicon optics and mechanics to integrate a lens, a DFB laser, a monitor photodiode (MPD) and a wavelength ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
7.
  • Wafer Scale Assembly and Te... Wafer Scale Assembly and Test for the Production of Opto-Electronic Components
    Kropp, J.-R. LEOS 2006 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2006-Oct.
    Conference Proceeding

    The trend of rising performance in combination with the reduction of size is still valid in the opto-electronic technology. That implies not only higher integration of functions into the chip but ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
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Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
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Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
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Celotno besedilo
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zadetkov: 12

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