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zadetkov: 388
1.
  • Improved Contacts to MoS2 T... Improved Contacts to MoS2 Transistors by Ultra-High Vacuum Metal Deposition
    English, Chris D; Shine, Gautam; Dorgan, Vincent E ... Nano letters, 06/2016, Letnik: 16, Številka: 6
    Journal Article
    Recenzirano
    Odprti dostop

    The scaling of transistors to sub-10 nm dimensions is strongly limited by their contact resistance (R C). Here we present a systematic study of scaling MoS2 devices and contacts with varying ...
Celotno besedilo
Dostopno za: IJS, KILJ, NUK, PNG, UL, UM

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2.
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3.
  • Strain Induced by Evaporate... Strain Induced by Evaporated-Metal Contacts on Monolayer MoS2 Transistors
    Jaikissoon, Marc; Pop, Eric; Saraswat, Krishna C. IEEE electron device letters, 2024-Aug., Letnik: 45, Številka: 8
    Journal Article
    Recenzirano

    Electron-beam evaporation is commonly used to form metal contacts on two-dimensional (2D) materials. Many evaporated metals contain high levels of stress, but the effect of this stress on 2D device ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
4.
  • Infrared Detectable MoS2 Ph... Infrared Detectable MoS2 Phototransistor and Its Application to Artificial Multilevel Optic-Neural Synapse
    Kim, Seung-Geun; Kim, Seung-Hwan; Park, June ... ACS nano, 09/2019, Letnik: 13, Številka: 9
    Journal Article
    Recenzirano

    Layered two-dimensional (2D) materials have entered the spotlight as promising channel materials for future optoelectronic devices owing to their excellent electrical and optoelectronic properties. ...
Celotno besedilo
Dostopno za: IJS, KILJ, NUK, PNG, UL, UM
5.
  • High-specific-power flexibl... High-specific-power flexible transition metal dichalcogenide solar cells
    Nassiri Nazif, Koosha; Daus, Alwin; Hong, Jiho ... Nature communications, 12/2021, Letnik: 12, Številka: 1
    Journal Article
    Recenzirano
    Odprti dostop

    Semiconducting transition metal dichalcogenides (TMDs) are promising for flexible high-specific-power photovoltaics due to their ultrahigh optical absorption coefficients, desirable band gaps and ...
Celotno besedilo
Dostopno za: NUK, UL, UM, UPUK

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6.
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Dostopno za: IJS, KILJ, NUK, PNG, UL, UM
7.
  • Fast-Response Flexible Temp... Fast-Response Flexible Temperature Sensors with Atomically Thin Molybdenum Disulfide
    Daus, Alwin; Jaikissoon, Marc; Khan, Asir Intisar ... Nano letters, 08/2022, Letnik: 22, Številka: 15
    Journal Article
    Recenzirano

    Real-time thermal sensing on flexible substrates could enable a plethora of new applications. However, achieving fast, sub-millisecond response times even in a single sensor is difficult, due to the ...
Celotno besedilo
Dostopno za: IJS, KILJ, NUK, PNG, UL, UM
8.
  • Analysis of Atomistic Dopan... Analysis of Atomistic Dopant Variation and Fermi Level Depinning in Nanoscale Contacts
    Shine, Gautam; Saraswat, Krishna C. I.E.E.E. transactions on electron devices/IEEE transactions on electron devices, 09/2017, Letnik: 64, Številka: 9
    Journal Article
    Recenzirano
    Odprti dostop

    Using quantum transport simulations of metal-semiconductor junctions, we assess the viability of barrier thinning with dopants and barrier lowering with interfacial layers as solutions for contact ...
Celotno besedilo
Dostopno za: IJS, NUK, UL

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9.
  • Demonstration of a Ge/GeSn/... Demonstration of a Ge/GeSn/Ge Quantum-Well Microdisk Resonator on Silicon: Enabling High-Quality Ge(Sn) Materials for Micro- and Nanophotonics
    Chen, Robert; Gupta, Suyog; Huang, Yi-Chiau ... Nano letters, 01/2014, Letnik: 14, Številka: 1
    Journal Article
    Recenzirano

    We theoretically study and experimentally demonstrate a pseudomorphic Ge/Ge0.92Sn0.08/Ge quantum-well microdisk resonator on Ge/Si (001) as a route toward a compact GeSn-based laser on silicon. The ...
Celotno besedilo
Dostopno za: IJS, KILJ, NUK, PNG, UL, UM
10.
  • 7-nm FinFET CMOS Design Ena... 7-nm FinFET CMOS Design Enabled by Stress Engineering Using Si, Ge, and Sn
    Gupta, Suyog; Moroz, Victor; Smith, Lee ... IEEE transactions on electron devices, 05/2014, Letnik: 61, Številka: 5
    Journal Article
    Recenzirano

    Bandgap and stress engineering using group IV materials-Si, Ge, and Sn, and their alloys are employed to design a FinFET-based CMOS solution for the 7-nm technology node and beyond. A detailed ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
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zadetkov: 388

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