Akademska digitalna zbirka SLovenije - logo

Rezultati iskanja

Osnovno iskanje    Ukazno iskanje   

Trenutno NISTE avtorizirani za dostop do e-virov konzorcija SI. Za polni dostop se PRIJAVITE.

1 2 3 4 5
zadetkov: 687
1.
  • A 28 nm Configurable Memory... A 28 nm Configurable Memory (TCAM/BCAM/SRAM) Using Push-Rule 6T Bit Cell Enabling Logic-in-Memory
    Jeloka, Supreet; Akesh, Naveen Bharathwaj; Sylvester, Dennis ... IEEE journal of solid-state circuits, 2016-April, 2016-4-00, 20160401, Letnik: 51, Številka: 4
    Journal Article
    Recenzirano

    Conventional content addressable memory (BCAM and TCAM) uses specialized 10T/16T bit cells that are significantly larger than 6T SRAM cells. A new BCAM/TCAM is proposed that can operate with standard ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
2.
  • A Portable 2-Transistor Pic... A Portable 2-Transistor Picowatt Temperature-Compensated Voltage Reference Operating at 0.5 V
    Mingoo Seok; Gyouho Kim; Blaauw, D. ... IEEE journal of solid-state circuits, 10/2012, Letnik: 47, Številka: 10
    Journal Article
    Recenzirano

    Sensing systems such as biomedical implants, infrastructure monitoring systems, and military surveillance units are constrained to consume only picowatts to nanowatts in standby and active mode, ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
3.
  • An All-Digital Edge Racing ... An All-Digital Edge Racing True Random Number Generator Robust Against PVT Variations
    Yang, Kaiyuan; Blaauw, David; Sylvester, Dennis IEEE journal of solid-state circuits, 2016-April, 2016-4-00, 20160401, Letnik: 51, Številka: 4
    Journal Article
    Recenzirano

    This paper presents an all-digital true random number generator (TRNG) harvesting entropy from the collapse of two edges injected into one even-stage ring, fabricated in 40 and 180 nm CMOS ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
4.
  • Near-Threshold Computing: R... Near-Threshold Computing: Reclaiming Moore's Law Through Energy Efficient Integrated Circuits
    Dreslinski, Ronald G.; Wieckowski, Michael; Blaauw, David ... Proceedings of the IEEE, 02/2010, Letnik: 98, Številka: 2
    Journal Article
    Recenzirano

    Power has become the primary design constraint for chip designers today. While Moore's law continues to provide additional transistors, power budgets have begun to prohibit those devices from ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
5.
  • A Fully-Integrated 71 nW CM... A Fully-Integrated 71 nW CMOS Temperature Sensor for Low Power Wireless Sensor Nodes
    Seokhyeon Jeong; Zhiyoong Foo; Yoonmyung Lee ... IEEE journal of solid-state circuits, 08/2014, Letnik: 49, Številka: 8
    Journal Article
    Recenzirano

    We propose a fully-integrated temperature sensor for battery-operated, ultra-low power microsystems. Sensor operation is based on temperature independent/dependent current sources that are used with ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
6.
  • An Ultra-Low Power Fully In... An Ultra-Low Power Fully Integrated Energy Harvester Based on Self-Oscillating Switched-Capacitor Voltage Doubler
    Wanyeong Jung; Sechang Oh; Suyoung Bang ... IEEE journal of solid-state circuits, 12/2014, Letnik: 49, Številka: 12
    Journal Article
    Recenzirano

    This paper presents a fully integrated energy harvester that maintains >35% end-to-end efficiency when harvesting from a 0.84 mm 2 solar cell in low light condition of 260 lux, converting 7 nW input ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
7.
  • Computing the Soft Error Ra... Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors
    Rao, R.R.; Chopra, K.; Blaauw, D.T. ... IEEE transactions on computer-aided design of integrated circuits and systems, 03/2007, Letnik: 26, Številka: 3
    Journal Article
    Recenzirano

    Soft errors have emerged as an important reliability challenge for nanoscale very large scale integration designs. In this paper, we present a fast and efficient soft error rate (SER) analysis ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
8.
  • iRazor: Current-Based Error... iRazor: Current-Based Error Detection and Correction Scheme for PVT Variation in 40-nm ARM Cortex-R4 Processor
    Zhang, Yiqun; Khayatzadeh, Mahmood; Yang, Kaiyuan ... IEEE journal of solid-state circuits, 02/2018, Letnik: 53, Številka: 2
    Journal Article
    Recenzirano
    Odprti dostop

    This paper presents iRazor, a lightweight error detection and correction approach, to suppress the cycle time margin that is traditionally added to very large scale integration systems to tolerate ...
Celotno besedilo
Dostopno za: IJS, NUK, UL

PDF
9.
  • New Associate Editor New Associate Editor
    Sylvester, Dennis IEEE journal of solid-state circuits 59, Številka: 5
    Journal Article
    Recenzirano
    Odprti dostop

    It is with great pleasure that I welcome Prof. Q. Jane Gu to the Editorial Board of the IEEE Journal Of Solid-State Circuits as a new Associate Editor. Prof. Gu is an expert in high-speed integrated ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
10.
  • New Associate Editor New Associate Editor
    Sylvester, Dennis IEEE journal of solid-state circuits, 2/2024, Letnik: 59, Številka: 2
    Journal Article
    Recenzirano
    Odprti dostop

    It is with great pleasure that I welcome Prof. Priyanka Raina to the Editorial Board of the IEEE Journal of Solid-State Circuits as a new Associate Editor. Prof. Raina is an expert in architectures ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
1 2 3 4 5
zadetkov: 687

Nalaganje filtrov