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1 2 3
zadetkov: 22
1.
  • Realization of a multinode ... Realization of a multinode quantum network of remote solid-state qubits
    Pompili, M; Hermans, S L N; Baier, S ... Science (American Association for the Advancement of Science), 04/2021, Letnik: 372, Številka: 6539
    Journal Article
    Recenzirano
    Odprti dostop

    The distribution of entangled states across the nodes of a future quantum internet will unlock fundamentally new technologies. Here, we report on the realization of a three-node entanglement-based ...
Celotno besedilo
Dostopno za: NUK, ODKLJ

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2.
  • On the Trade-Off Between Qu... On the Trade-Off Between Quality Factor and Tuning Ratio in Tunable High-Frequency Capacitors
    Tiggelman, M.P.J.; Reimann, K.; Van Rijs, F. ... IEEE transactions on electron devices, 09/2009, Letnik: 56, Številka: 9
    Journal Article
    Recenzirano
    Odprti dostop

    A benchmark of tunable and switchable devices at microwave frequencies is presented on the basis of physical limitations to show their potential for reconfigurable cellular applications. Performance ...
Celotno besedilo
Dostopno za: IJS, NUK, UL

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3.
  • Ferroelectric Thin-Film Cap... Ferroelectric Thin-Film Capacitors and Piezoelectric Switches for Mobile Communication Applications
    Klee, Mareike; Van Esch, Marco; Keur, Wilco ... IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 08/2009, Letnik: 56, Številka: 8
    Journal Article, Conference Proceeding
    Recenzirano
    Odprti dostop

    Thin-film ferroelectric capacitors have been integrated with resistors and active functions such as ESD protection into small, miniaturized modules, which enable a board space saving of up to 80%. ...
Celotno besedilo
Dostopno za: IJS, NUK, UL

PDF
4.
  • Fast RF-CV Characterization... Fast RF-CV Characterization Through High-Speed 1-port S-Parameter Measurements
    Herfst, R. W.; Steeneken, P. G.; Tiggelman, M. P. J. ... IEEE transactions on semiconductor manufacturing, 08/2012, Letnik: 25, Številka: 3
    Journal Article, Conference Proceeding
    Recenzirano
    Odprti dostop

    We present a fast radio frequency-capacitance-voltage (RF-CV) method to measure the CV relation of an electronic device. The approach is more accurate, much faster, and more cost effective compared ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
5.
Celotno besedilo
Dostopno za: GEOZS, IJS, IMTLJ, KILJ, KISLJ, NUK, OILJ, PNG, SAZU, SBCE, SBJE, UL, UM, UPCLJ, UPUK
6.
  • Multiplexed quantum transpo... Multiplexed quantum transport using commercial off-the-shelf CMOS at sub-kelvin temperatures
    Paquelet, Wuetz B; Bavdaz, P L; Yeoh, L A ... npj quantum information, 05/2020, Letnik: 6, Številka: 1
    Journal Article
    Recenzirano
    Odprti dostop

    Continuing advancements in quantum information processing have caused a paradigm shift from research mainly focused on testing the reality of quantum mechanics to engineering qubit devices with ...
Celotno besedilo
Dostopno za: NUK, UL, UM, UPUK

PDF
7.
  • Fast RF-CV characterization... Fast RF-CV characterization through high-speed 1-port S-parameter measurements
    Herfst, R W; Steeneken, P G; Tiggelman, M P J ... 2010 International Conference on Microelectronic Test Structures (ICMTS), 2010-March
    Conference Proceeding
    Odprti dostop

    We present a novel method to measure the capacitance-voltage relation of an electronic device. The approach is accurate, very fast, and cost-effective compared to the existing off-the-shelf ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
8.
  • Identifying dielectric and ... Identifying dielectric and resistive electrode losses in high-density capacitors at radio frequencies
    Tiggelman, M.P.J.; Reimann, K.; Liu, J. ... 2008 IEEE International Conference on Microelectronic Test Structures, 2008-March
    Conference Proceeding
    Odprti dostop

    A regression-based technique is presented which distinguishes the dielectric loss from the resistive loss of high density planar capacitors in a very wide bandwidth of 0.1-8 GHz. Moreover, the ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM

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9.
  • Reducing AC impedance measu... Reducing AC impedance measurement errors caused by the DC voltage dependence of broadband high-voltage bias-tees
    Tiggelman, M.P.J.; Reimann, K.; Schmitz, J. 2007 IEEE International Conference on Microelectronic Test Structures, 2007-March
    Conference Proceeding
    Odprti dostop

    During the AC impedance characterization of devices, from the kHz-range up to the GHz-range, accuracy can be lost when a DC voltage is applied. Commercial high-voltage broadband bias-tees are often ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM

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10.
  • MI004 miniaturised, high pe... MI004 miniaturised, high performance ferroelectric and piezoelectric thin film devices
    Klee, M.; Keur, W.; Mauczok, R. ... 2008 17th IEEE International Symposium on the Applications of Ferroelectrics, 2008-Feb., Letnik: 2
    Conference Proceeding
    Odprti dostop

    Thin film ferroelectric capacitors have been integrated with resistors and active functions such as ESD protection into small, miniaturized modules, which enable a board space saving of up to 80%. ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
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zadetkov: 22

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