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1 2 3 4 5
zadetkov: 48
1.
  • Surface Emitting Quantum-Ca... Surface Emitting Quantum-Cascade Ring Laser
    Babichev, A. V.; Kolodeznyi, E. S.; Gladyshev, A. G. ... Semiconductors (Woodbury, N.Y.), 07/2021, Letnik: 55, Številka: 7
    Journal Article
    Recenzirano

    Quantum-cascade lasers with surface emission of radiation by means of a grating formed in the upper waveguide cladding layers by ion-beam milling are fabricated and studied. The active region of the ...
Celotno besedilo
Dostopno za: DOBA, EMUNI, FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, IZUM, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, SIK, UILJ, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
2.
  • Photoluminescence Study of ... Photoluminescence Study of AlGaAs/GaAs after Focused Ion Beam Milling
    Voznyuk, G. V.; Grigorenko, I. N.; Mitrofanov, M. I. ... Semiconductors (Woodbury, N.Y.), 12/2020, Letnik: 54, Številka: 14
    Journal Article
    Recenzirano

    Light-emitting devices of modern photonics are based on the semiconductor structures containing layers with various physical parameters. To preserve initial parameters during focused ion beam (FIB) ...
Celotno besedilo
Dostopno za: DOBA, EMUNI, FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, IZUM, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, SIK, UILJ, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
3.
  • Subwave Textured Surfaces f... Subwave Textured Surfaces for the Radiation Coupling from the Waveguide
    Voznyuk, G. V.; Grigorenko, I. N.; Mitrofanov, M. I. ... Technical physics letters, 12/2023, Letnik: 49, Številka: Suppl 3
    Journal Article
    Recenzirano

    The paper presents a procedure for creating on GaAs(100) substrates textured surfaces by ion-beam etching with a focused beam. The possibility of flexibly controlling the shape and profile of the ...
Celotno besedilo
Dostopno za: EMUNI, FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
4.
  • On the Effect of Etching wi... On the Effect of Etching with a Focused Ga+ Ion Beam in the Energy Range 12–30 keV on the Luminescent Properties of the Al0.18Ga0.82As/GaAs/Al0.18Ga0.82As Heterostructure
    Voznyuk, G. V.; Grigorenko, I. N.; Lila, A. S. ... Semiconductors (Woodbury, N.Y.), 06/2023, Letnik: 57, Številka: 6
    Journal Article
    Recenzirano

    The effect of ion energy in a focused ion beam in the range 12–30 keV on the formation depth of nonradiative recombination centers during etching of the Al 0 . 18 Ga 0 . 82 As/GaAs/Al 0 . 18 Ga 0 . ...
Celotno besedilo
Dostopno za: DOBA, FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, IZUM, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, SIK, UILJ, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
5.
  • Lateral Mode Tuning in Coup... Lateral Mode Tuning in Coupled Ridge Waveguides Using Focused Ion Beam
    Payusov, A. S.; Serin, A. A.; Kornyshov, G. O. ... Semiconductors (Woodbury, N.Y.), 12/2020, Letnik: 54, Številka: 14
    Journal Article
    Recenzirano

    We present an approach for the treatment of coupled-ridge lasers using focused ion beam⁠ (FIB) etching. We show experimentally that the FIB etching allows post-processing lateral mode tuning without ...
Celotno besedilo
Dostopno za: DOBA, FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, IZUM, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, SIK, UILJ, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
6.
  • Study of the Spatial Charac... Study of the Spatial Characteristics of Emission of Surface-Emitting Ring Quantum-Cascade Lasers
    Babichev, A. V.; Mikhailov, D. A.; Chistyakov, D. V. ... Semiconductors (Woodbury, N.Y.), 09/2023, Letnik: 57, Številka: 9
    Journal Article
    Recenzirano

    The results of studies of ring quantum-cascade lasers with surface emission due to a second-order grating formed in the top cladding layers are presented. Surface emission near 7.85 μm with a low ...
Celotno besedilo
Dostopno za: FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
7.
  • Changes in the Photolumines... Changes in the Photoluminescence Properties of Semiconductor Heterostructures after Ion-Beam Etching
    Levitskii, Ya. V.; Mitrofanov, M. I.; Voznyuk, G. V. ... Semiconductors (Woodbury, N.Y.), 11/2019, Letnik: 53, Številka: 11
    Journal Article
    Recenzirano

    The ion-beam etching of AlGaAs/GaAs heterostructures gives rise to radiation defects and, as a result, leads to photoluminescence quenching. Annealing at 620°C in an atmosphere of As almost ...
Celotno besedilo
Dostopno za: FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
8.
  • Surface-Emitting Quantum-Ca... Surface-Emitting Quantum-Cascade Lasers with a Grating Formed by Focused Ion Beam Milling
    Babichev, A. V.; Mikhailov, D. A.; Kolodeznyi, E. S. ... Semiconductors (Woodbury, N.Y.), 10/2023, Letnik: 57, Številka: 10
    Journal Article
    Recenzirano

    The results of studies of 7.5–8.0 μm range surface-emitting ring quantum-cascade lasers are presented. A second- order diffraction grating with a calculated coupling coefficient of ~9 cm –1 is formed ...
Celotno besedilo
Dostopno za: FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
9.
  • Focused Ion Beam Milling of... Focused Ion Beam Milling of Ridge Waveguides of Edge-Emitting Semiconductor Lasers
    Payusov, A. S.; Mitrofanov, M. I.; Kornyshov, G. O. ... Technical physics letters, 12/2023, Letnik: 49, Številka: Suppl 3
    Journal Article
    Recenzirano

    We studied the influence of the focused ion beam milling of ridge waveguides on lasing parameters of edge-emitting lasers, based on a separate confinement double heterostructure. It is shown that ...
Celotno besedilo
Dostopno za: EMUNI, FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
10.
  • Enhancement of the Basal-Pl... Enhancement of the Basal-Plane Stacking Fault Emission in a GaN Planar Nanowire Microcavity
    Girshova, E. I.; Pozina, G.; Belonovskii, A. V. ... JETP letters, 2022, Letnik: 115, Številka: 10
    Journal Article
    Recenzirano

    We study and compare optical microcavities formed by GaN planar nanowires. Nanostructures with structural defects such as stacking faults and without defects are considered. The behavior of an ...
Celotno besedilo
Dostopno za: DOBA, EMUNI, FIS, FZAB, GEOZS, GIS, IJS, IMTLJ, IZUM, KILJ, KISLJ, MFDPS, NLZOH, NUK, OILJ, PILJ, PNG, SAZU, SBCE, SBJE, SBMB, SBNM, SIK, UILJ, UKNU, UL, UM, UPUK, VKSCE, ZAGLJ
1 2 3 4 5
zadetkov: 48

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