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  • Estimation of overheating o... Estimation of overheating of p-n junction and its effect on degradation of silicon high-power pulse impatt diodes
    Belyaev, A E; Basanets, V V; Boltovets, N S ... 2010 20th International Crimean Conference "Microwave & Telecommunication Technology", 2010-Sept.
    Conference Proceeding

    The estimation of thermal limitations for pulse operation mode in the 8 mm-wave band of double-drift impact avalanche and transit-time (IMPATT) diodes with microwave power ≥20 W. It is shown that at ...
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