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1.
  • Tailored birdcage resonator... Tailored birdcage resonator for magnetic resonance imaging at 7 T using 3D printing
    Kemper, Philip; Thöming, Jorg; Küstermann, Ekkehard HardwareX, 10/2022, Letnik: 12
    Journal Article
    Recenzirano
    Odprti dostop

    This study outlines the design, construction and characterization of a tailored low-cost linear birdcage (BC) resonator for magnetic resonance imaging at 7T. Typically, different BC designs found in ...
Celotno besedilo
Dostopno za: GEOZS, IJS, IMTLJ, KILJ, KISLJ, NLZOH, NUK, OILJ, PNG, SAZU, SBCE, SBJE, UILJ, UL, UM, UPCLJ, UPUK, ZAGLJ, ZRSKP
2.
  • Student EMC Hardware Design... Student EMC Hardware Design Contest 2022
    Radhakrishnan, Pavithrakrishnan IEEE electromagnetic compatibility magazine, 2022, Letnik: 11, Številka: 3
    Journal Article, Magazine Article
    Odprti dostop

    Greetings! I am elated to write an article for the IEEE EMC Magazine on the “Student EMC Hardware Design Contest 2022” as part of the 2022 IEEE International Symposium on EMC+SIPI in Spokane, ...
Celotno besedilo
Dostopno za: IJS, NUK, UL
3.
  • VeriSketch VeriSketch
    Ardeshiricham, Armaiti; Takashima, Yoshiki; Gao, Sicun ... Proceedings of the 2019 ACM SIGSAC Conference on Computer and Communications Security, 11/2019
    Conference Proceeding
    Odprti dostop

    We present VeriSketch, a security-oriented program synthesis framework for developing hardware designs with formal guarantee of functional and security specifications. VeriSketch defines a synthesis ...
Celotno besedilo
Dostopno za: NUK, UL

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Celotno besedilo

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5.
  • Behavioral Fingerprinting o... Behavioral Fingerprinting of IoT Devices
    Bezawada, Bruhadeshwar; Bachani, Maalvika; Peterson, Jordan ... Proceedings of the 2018 Workshop on Attacks and Solutions in Hardware Security, 01/2018
    Conference Proceeding

    The Internet-of-Things (IoT) has brought in new challenges in device identification --what the device is, and authentication --is the device the one it claims to be. Traditionally, the authentication ...
Celotno besedilo
Dostopno za: NUK, UL
6.
  • Error patterns in MLC NAND ... Error patterns in MLC NAND flash memory
    Cai, Yu; Haratsch, Erich F.; Mutlu, Onur ... Proceedings of the Conference on Design, Automation and Test in Europe, 03/2012
    Conference Proceeding

    As NAND flash memory manufacturers scale down to smaller process technology nodes and store more bits per cell, reliability and endurance of flash memory reduce. Wear-leveling and error correction ...
Celotno besedilo
Dostopno za: NUK, UL
7.
  • ShiDianNao ShiDianNao
    Du, Zidong; Fasthuber, Robert; Chen, Tianshi ... 2015 ACM/IEEE 42nd Annual International Symposium on Computer Architecture (ISCA), 06/2015
    Conference Proceeding

    In recent years, neural network accelerators have been shown to achieve both high energy efficiency and high performance for a broad application scope within the important category of recognition and ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
8.
  • FANCI FANCI
    Waksman, Adam; Suozzo, Matthew; Sethumadhavan, Simha Proceedings of the 2013 ACM SIGSAC conference on Computer & communications security, 11/2013
    Conference Proceeding

    Hardware design today bears similarities to software design. Often vendors buy and integrate code acquired from third-party organizations into their designs, especially in embedded/system-on-chip ...
Celotno besedilo
Dostopno za: NUK, UL
9.
  • Utility-Based Cache Partiti... Utility-Based Cache Partitioning
    Qureshi, Moinuddin K.; Patt, Yale N. 2006 39th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO'06), 12/2006
    Conference Proceeding

    This paper investigates the problem of partitioning a shared cache between multiple concurrently executing applications. The commonly used LRU policy implicitly partitions a shared cache on a demand ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
10.
  • Reliable on-chip systems in... Reliable on-chip systems in the nano-era
    Henkel, Jörg; Bauer, Lars; Dutt, Nikil ... 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 05/2013
    Conference Proceeding

    Reliability concerns due to technology scaling have been a major focus of researchers and designers for several technology nodes. Therefore, many new techniques for enhancing and optimizing ...
Celotno besedilo
Dostopno za: IJS, NUK, UL, UM
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zadetkov: 697.361

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