Qin, Yabo; Wang, Zongwei; Gao, Jiajun; Shan, Linbo; Wang, Qishen; Cai, Yimao; Huang, Ru
2023 Silicon Nanoelectronics Workshop (SNW),
2023-June-11
Conference Proceeding
In this study, a high-speed and self-calibratable true random number generator (TRNG) is demonstrated based on a unified selector-RRAM device with dual switching modes. In fast selector mode (∼35 ns), the V th fluctuation is the entropy for the high-speed TRNG. However, V th has large device-to-device (D2D) variation, which leads to unstable switching probability. By adjusting the resistance of RRAM, the D2D variation of V th can be substantially regulated through self-calibration ( 10\times \sigma/\mu improvement), enabling the reliable deployment of TRNG.
