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Tuinhout, H.; Duijnhoven, A. Z.
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS), 03/2013Conference Proceeding
This paper discusses the challenges of characterization of 1/f noise and its variability under weak-inversion operating conditions of MOSFETs. A dedicated test module was designed with a range of MOSFET types with different layout implementations, particularly focusing at the noise behavior of very wide transistors. Through extensive use of a commercial noise characterization system it proved possible to evaluate the variability of 1/f noise in weak-inversion, revealing several interesting and important subtleties of low frequency noise.
