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Salluzzo, M.; Gariglio, S.; Torrelles, X.; Ristic, Z.; Di Capua, R.; Drnec, J.; Sala, M. Moretti; Ghiringhelli, G.; Felici, R.; Brookes, N. B.
Advanced materials (Weinheim), April 24, 2013, Letnik: 25, Številka: 16Journal Article
A full understanding of the mechanism of the formation of a two‐dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X‐ray synchrotron‐based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.
