Balagan, Semyon; Chusovitin, Evgeniy; Goroshko, Dmitry; Goroshko, Olga
2017 Second Russia and Pacific Conference on Computer Technology and Applications (RPC),
2017-Sept.
Conference Proceeding
Currently, scanning probe microscopy (SPM) is actively used to obtain surface data. A large number of images require a fast and high-accuracy calculation of the topographic parameters of particles on the surface. The original grain analysis algorithm based on finding a local maximum is realized by sorting an array of points forming the topography of the SPM image surface. It provides to determine various topographic characteristics of objects located on a surface (height, lateral dimensions, area, volume, etc).
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