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An intelligent fault‐tolerant routing scheme for Internet of Things‐enabled wireless sensor networksChanak, Prasenjit; Banerjee, Indrajit; Bose, Sagar
International journal of communication systems, 25 November 2021, Letnik: 34, Številka: 17Journal Article
Summary Wireless sensor networks (WSNs) are one of the nonnegligible ingredients in any Internet of Things (IoT)‐based system. Fault tolerance in the IoT‐enabled WSNs is an essential part of avoiding harmful actions. Many approaches are reported in the literature on fault detection and fault tolerance for WSNs. However, they either consume additional energy to identify and tolerate failures or use extra hardware and software resources. This paper proposes an intelligent fault tolerance routing scheme for IoT‐enabled WSNs that significantly improves the QoS of the IoT‐enabled WSNs. We propose a novel two‐population z‐test‐based fault detection mechanism to detect faulty nodes in the networks. Furthermore, an intelligent routing scheme is proposed that reuses different partially faulty nodes to tolerate faults within the network. An extensive experiment on the proposed intelligent fault tolerance routing scheme is performed to demonstrate the efficiency of the proposed scheme. Experiment results are compared with the state‐of‐the‐art algorithms to show the effectiveness of the proposed scheme in terms of false‐positive rate, false alarm rate, fault detection accuracy, energy consumption, fault detection accuracy, and network lifetime. This paper proposes an intelligent fault tolerance routing scheme for IoT‐enabled WSNs that significantly improves the QoS of the IoT‐enabled WSNs. Furthermore, an intelligent routing scheme is proposed that reuses different partially faulty nodes to tolerate faults within the network. Experiment results are compared with the state‐of‐the‐art algorithms to show the effectiveness of the proposed scheme in terms of false‐positive rate, false alarm rate, fault detection accuracy, energy consumption, fault detection accuracy, and network lifetime.
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