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Payusov, A. S.; Serin, A. A.; Kornyshov, G. O.; Kulagina, M. M.; Mitrofanov, M. I.; Voznyuk, G. V.; Evtikhiev, V. P.; Maximov, M. V.; Gordeev, N. Yu
Semiconductors (Woodbury, N.Y.), 12/2020, Letnik: 54, Številka: 14Journal Article
We present an approach for the treatment of coupled-ridge lasers using focused ion beam (FIB) etching. We show experimentally that the FIB etching allows post-processing lateral mode tuning without deterioration of the main laser parameters.
