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OURMAZD, A; TAYLOR, D. W; CUNNINGHAM, J; TU, C. W
Physical review letters, 02/1989, Letnik: 62, Številka: 8Journal Article
Chemical lattice imaging is combined with digital pattern recognition to map, at near-atomic resolution, the compositional change across GaAs/AlGaAs interfaces of the highest optical quality. These maps quantify the information content of each unit cell of the lattice image. Results show that state-of-art GaAs /AlGaAs interfaces contain substantial atomic roughness on scales finer than suggested by optical measurements. (Author)
