In the last 50 years solid state devices have been widely used as radiation detectors (photons, betas, fast electrons and heavy ions) thanks to the advantages they offer with respect to photomultiplier tubes technology. However, despite their benefits (low power consumption, small size, low costs), semiconductors are very sensitive to temperature variations. This means that for those experiments using solid state detectors without any thermal control, the correct operation of the detectors is affected by the environmental condition. To solve this problem Hamamatsu Photonics realized the C11204-01 device: a special voltage supply module for silicon photomultipliers which compensates the overvoltage at different temperatures. In the following work we present the results of the calibration of this device and a test we performed on a silicon photomultiplier, by means of a LabVIEWTM interface designed ad hoc for this purpose.