E-viri
Recenzirano
-
Poryvaev, Artem S; Larionov, Kirill P; Albrekht, Yana N; Efremov, Alexander A; Kiryutin, Alexey S; Smirnova, Kristina A; Evtushok, Vasiliy Y; Fedin, Matvey V
Physical chemistry chemical physics : PCCP, 05/2023, Letnik: 25, Številka: 2Journal Article
Probes sensitive to mechanical stress are in demand for the analysis of pressure distribution in materials, and the design of pressure sensors based on metal-organic frameworks (MOFs) is highly promising due to their structural tunability. We report a new pressure-sensing material, which is based on the UiO-66 framework with trace amounts of a spin probe (0.03 wt%) encapsulated in cavities. To obtain this material, we developed an approach for encapsulation of stable nitroxide radical TEMPO ((2,2,6,6-tetramethylpiperidin-1-yl)oxyl) into the micropores of UiO-66 during its solvothermal synthesis. Pressure read-out using electron paramagnetic resonance (EPR) spectroscopy allows monitoring the degradation of the defected MOF structure upon pressurization, where full collapse of pores occurs at as low a pressure as 0.13 GPa. The developed methodology can be used in and ex situ and provides sensitive tools for non-destructive mapping of pressure effects in various materials. The metal-organic framework UiO-66 with embedded nitroxide radicals represents a new strategy for the design of MOF-nitroxide-based pressure sensors with non-invasive EPR detection.
Vnos na polico
Trajna povezava
- URL:
Faktor vpliva
Dostop do baze podatkov JCR je dovoljen samo uporabnikom iz Slovenije. Vaš trenutni IP-naslov ni na seznamu dovoljenih za dostop, zato je potrebna avtentikacija z ustreznim računom AAI.
Leto | Faktor vpliva | Izdaja | Kategorija | Razvrstitev | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Baze podatkov, v katerih je revija indeksirana
Ime baze podatkov | Področje | Leto |
---|
Povezave do osebnih bibliografij avtorjev | Povezave do podatkov o raziskovalcih v sistemu SICRIS |
---|
Vir: Osebne bibliografije
in: SICRIS
To gradivo vam je dostopno v celotnem besedilu. Če kljub temu želite naročiti gradivo, kliknite gumb Nadaljuj.